High-Fidelity Quantum Logic Gates Using Trapped-Ion Hyperfine Qubits-Reference-Cited by-同舟云学术

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High-Fidelity Quantum Logic Gates Using Trapped-Ion Hyperfine Qubits

Published:2016-08-04 Issue:6 Volume:117 Page:
ISSN:0031-9007
Container-title:Physical Review Letters
language:en
Short-container-title:Phys. Rev. Lett.

Author:

Ballance C. J.,Harty T. P.,Linke N. M.,Sepiol M. A.,Lucas D. M.

Funder

Engineering and Physical Sciences Research Council

Army Research Office

Publisher

American Physical Society (APS)

Subject

General Physics and Astronomy

Link

http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevLett.117.060504/fulltext

Reference50 articles.

1. Overhead and noise threshold of fault-tolerant quantum error correction

2. Quantum computing with realistically noisy devices

3. Topological fault-tolerance in cluster state quantum computation

4. Surface codes: Towards practical large-scale quantum computation

5. Deterministic Entanglement of Two Trapped Ions

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