Direct Observation of Localized Defect States in Semiconductor Nanotube Junctions-Reference-Cited by-同舟云学术

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Direct Observation of Localized Defect States in Semiconductor Nanotube Junctions

Published:2003-05-29 Issue:21 Volume:90 Page:
ISSN:0031-9007
Container-title:Physical Review Letters
language:en
Short-container-title:Phys. Rev. Lett.

Author:

Kim Hajin,Lee J.,Kahng S.-J.,Son Y.-W.,Lee S. B.,Lee C.-K.,Ihm J.,Kuk Young

Publisher

American Physical Society (APS)

Subject

General Physics and Astronomy

Link

http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevLett.90.216107/fulltext

Reference19 articles.

1. Carbon Nanotubes as Molecular Quantum Wires

2. Carbon Nanotubes--the Route Toward Applications

3. Helical microtubules of graphitic carbon

4. Carbon nanotube intramolecular junctions

5. Atomically Resolved Single-Walled Carbon Nanotube Intramolecular Junctions

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