Absolute Measurement of Structure Factors with High Precision
Author:
Publisher
American Physical Society (APS)
Subject
General Physics and Astronomy
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevLett.19.22/fulltext
Reference8 articles.
1. Absolute Measurement of Structure Factors of Si Single Crystal by Means of X-Ray Pendellösung Fringes
2. Effects of X-Ray Polarization on Pendellösung Fringes
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4. Notizen: Dynamical X-ray Diffraction Theory of Spherical Waves
5. A theoretical study of pendellösung fringes. I. General considerations
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