Imaging of Surface Plasmon Scattering by Lithographically Created Individual Surface Defects
Author:
Publisher
American Physical Society (APS)
Subject
General Physics and Astronomy
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevLett.77.3877/fulltext
Reference8 articles.
1. Near-field optical measurement of the surface plasmon field
2. Determination of the spatial extension of the surface-plasmon evanescent field of a silver film with a photon scanning tunneling microscope
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5. Near‐field direct‐write ultraviolet lithography and shear force microscopic studies of the lithographic process
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