Evidence for internal dielectronic excitation of slow highly charged uranium ions-Reference-Cited by-同舟云学术

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Evidence for internal dielectronic excitation of slow highly charged uranium ions

Published:1993-02-22 Issue:8 Volume:70 Page:1073-1076
ISSN:0031-9007
Container-title:Physical Review Letters
language:en
Short-container-title:Phys. Rev. Lett.

Author:

Schuch R.,Schneider D.,Knapp D. A.,DeWitt D.,McDonald J.,Chen M. H.,Clark M. W.,Marrs R. E.

Publisher

American Physical Society (APS)

Subject

General Physics and Astronomy

Link

http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevLett.70.1073/fulltext

Reference18 articles.

1. Electron emission induced by multiply charged Ar ions impinging on a tungsten surface

2. Observation of high electron emission yields following highly charged ion impact (up toTh75+) on surfaces

3. Electron emission during interactions of multicharged N and Ar ions with Au(110) and Cu(001) surfaces

4. The Electron Beam Method of Production of Highly Charged Ions and Its Applications

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2. Charge exchange of slow highly charged ions from an electron beam ion trap with surfaces and 2D materials;Journal of Physics B: Atomic, Molecular and Optical Physics;2024-03-18

3. Experimental investigations of two‐electron relaxation processes in Rydberg hollow atoms;X-Ray Spectrometry;2023-07-02

4. Critical velocities for the nanostructure creation on a metal surface by an impact of slow highly charged Ar$$^{q+}$$, Kr$$^{q+}$$, and Xe$$^{q+}$$ ions;The European Physical Journal D;2023-01

5. K-x-ray emission of 1.5–20 keV/q Oq+ (q = 3, 5, 6) and Nq+ (q = 3, 5) ions impinging on nickel surface;The European Physical Journal Plus;2022-09-07

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