Hall-Effect Measurements Probing the Degree of Charge-Carrier Delocalization in Solution-Processed Crystalline Molecular Semiconductors-Reference-Cited by-同舟云学术

Hall-Effect Measurements Probing the Degree of Charge-Carrier Delocalization in Solution-Processed Crystalline Molecular Semiconductors

Published:2011-08-02 Issue:6 Volume:107 Page:
ISSN:0031-9007
Container-title:Physical Review Letters
language:en
Short-container-title:Phys. Rev. Lett.

Author:

Chang Jui-Fen,Sakanoue Tomo,Olivier Yoann,Uemura Takafumi,Dufourg-Madec Marie-Beatrice,Yeates Stephen G.,Cornil Jérôme,Takeya Jun,Troisi Alessandro,Sirringhaus Henning

Publisher

American Physical Society (APS)

Subject

General Physics and Astronomy

Link

http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevLett.107.066601/fulltext

Reference14 articles.

1. Quantum coherence and carriers mobility in organic semiconductors

2. Charge-Transport Regime of Crystalline Organic Semiconductors: Diffusion Limited by Thermal Off-Diagonal Electronic Disorder

3. Theory of Hall Effect. I

4. Hall Effect in the Accumulation Layers on the Surface of Organic Semiconductors

5. Free-electron-like Hall effect in high-mobility organic thin-film transistors

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