Measurements of Electron Inelastic Mean Free Paths in Materials
Author:
Publisher
American Physical Society (APS)
Subject
General Physics and Astronomy
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevLett.104.206601/fulltext
Reference31 articles.
1. Surface sensitivity of X-ray photoelectron spectroscopy
2. Element-selective imaging of atomic columns in a crystal using STEM and EELS
3. Atomic-Scale Chemical Imaging of Composition and Bonding by Aberration-Corrected Microscopy
4. Photoelectron Diffraction in Magnetic Linear Dichroism
5. Emission-Depth-Selective Auger Photoelectron Coincidence Spectroscopy
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