Correlation of Stress and Atomic-Scale Surface Roughness Evolution during Intermittent Homoepitaxial Growth of (111)-Oriented Ag and Cu
Author:
Publisher
American Physical Society (APS)
Subject
General Physics and Astronomy
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevLett.93.056104/fulltext
Reference17 articles.
1. Measurements of stress during vapor deposition of copper and silver thin films and multilayers
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