Transient-Capacitance Measurement of the Grain Boundary Levels in Semiconductors
Author:
Publisher
American Physical Society (APS)
Subject
General Physics and Astronomy
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevLett.48.424/fulltext
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1. Transient Response of Grain Boundaries and Its Application for a Novel Light Sensor
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