Spectroscopic Evidence for the Tricapped Trigonal Prism Structure of Semiconductor Clusters-Reference-Cited by-同舟云学术

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Spectroscopic Evidence for the Tricapped Trigonal Prism Structure of Semiconductor Clusters

Published:2000-08-21 Issue:8 Volume:85 Page:1666-1669
ISSN:0031-9007
Container-title:Physical Review Letters
language:en
Short-container-title:Phys. Rev. Lett.

Author:

Müller Jürgen,Liu Bei,Shvartsburg Alexandre A.,Ogut Serdar,Chelikowsky James R.,Siu K. W. Michael,Ho Kai-Ming,Gantefor Gerd

Publisher

American Physical Society (APS)

Subject

General Physics and Astronomy

Link

http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevLett.85.1666/fulltext

Reference29 articles.

1. Ionization of medium-sized silicon clusters and the geometries of the cations

2. Bonding and stabilities of small silicon clusters: A theoretical study of Si7–Si10

3. Equilibrium Structures and Finite Temperature Properties of Silicon Microclusters fromab initioMolecular-Dynamics Calculations

4. Electronic structures of the negative ions Si−2 –Si−10: Electron affinities of small silicon clusters

5. Tin clusters adopt prolate geometries

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