Sensitivity-Enhanced Electron-Holographic Interferometry and Thickness-Measurement Applications at Atomic Scale
Author:
Publisher
American Physical Society (APS)
Subject
General Physics and Astronomy
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevLett.54.60/fulltext
Reference15 articles.
1. Fresnelscher Interferenzversuch mit einem Biprisma f�r Elektronenwellen
2. Observation of recorded magnetization pattern by electron holography
3. Microscopy by reconstructed wave-fronts
4. Microscopy by Reconstructed Wave Fronts: II
5. Phase-Difference Amplification by Nonlinear Holograms
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