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Comparative Study of Defects in Semiconductors by Electrolyte Electroreflectance and Spectroscopic Ellipsometry

  • Published:1984-11-12 Issue:20 Volume:53 Page:1958-1961
  • ISSN:0031-9007
  • Container-title:Physical Review Letters
  • language:en
  • Short-container-title:Phys. Rev. Lett.

Author:

Raccah Paul M.,Garland J. W.,Zhang Z.,Lee U.,Xue Da Zhong,Abels L. L.,Ugur S.,Wilinsky W.

Publisher

American Physical Society (APS)

Subject

General Physics and Astronomy

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