Author:
Cohen C.,Drigo A. V.,Bernas H.,Chaumont J.,Królas K.,Thomé L.
Publisher
American Physical Society (APS)
Subject
General Physics and Astronomy
Cited by
32 articles.
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1. Quantification of cesium surface contamination on silicon resulting from SIMS analysis;Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena;2012-05
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3. Wear resistance of amorphous alloys and related materials;International Materials Reviews;2002-04
4. Amorphization of metals by ion implantation and ion mixing methods;Russian Physics Journal;1994-08
5. Thermal and Ar ion beam annealing of surface amorphous layers produced by Sb implanted into 〈100〉 Ni single crystal;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1994-06