InN Thin Film Lattice Dynamics by Grazing Incidence Inelastic X-Ray Scattering-Reference-Cited by-同舟云学术

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InN Thin Film Lattice Dynamics by Grazing Incidence Inelastic X-Ray Scattering

Published:2011-05-19 Issue:20 Volume:106 Page:
ISSN:0031-9007
Container-title:Physical Review Letters
language:en
Short-container-title:Phys. Rev. Lett.

Author:

Serrano J.,Bosak A.,Krisch M.,Manjón F. J.,Romero A. H.,Garro N.,Wang X.,Yoshikawa A.,Kuball M.

Publisher

American Physical Society (APS)

Subject

General Physics and Astronomy

Link

http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevLett.106.205501/fulltext

Reference22 articles.

1. Unusual properties of the fundamental band gap of InN

2. Absorption and Emission of Hexagonal InN. Evidence of Narrow Fundamental Band Gap

3. Evidence forp-Type Doping of InN

4. Stabilization of Bulkp-Type and Surfacen-Type Carriers in Mg-Doped InN{0001}Films

5. Experimental studies of lattice dynamical properties in indium nitride

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4. Effects of Internal Relaxation of Biaxial Strain on Structural and Electronic Properties of In0.5Al0.5N Thin Film;Coatings;2022-04-28

5. Comparison of the Possibilities of Inelastic Scattering of Synchrotron Radiation and Neutrons for Studying Atomic, Molecular, and Magnetic Dynamics in Condensed Matter;Crystallography Reports;2022-02

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