Unraveling the Intrinsic and Robust Nature of van Hove Singularities in Twisted Bilayer Graphene by Scanning Tunneling Microscopy and Theoretical Analysis-Reference-Cited by-同舟云学术

Unraveling the Intrinsic and Robust Nature of van Hove Singularities in Twisted Bilayer Graphene by Scanning Tunneling Microscopy and Theoretical Analysis

Published:2012-11-08 Issue:19 Volume:109 Page:
ISSN:0031-9007
Container-title:Physical Review Letters
language:en
Short-container-title:Phys. Rev. Lett.

Author:

Brihuega I.,Mallet P.,González-Herrero H.,Trambly de Laissardière G.,Ugeda M. M.,Magaud L.,Gómez-Rodríguez J. M.,Ynduráin F.,Veuillen J.-Y.

Publisher

American Physical Society (APS)

Subject

General Physics and Astronomy

Link

http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevLett.109.196802/fulltext

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