Direct Determination of the Chemical Bonding of Individual Impurities in Graphene-Reference-Cited by-同舟云学术

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Direct Determination of the Chemical Bonding of Individual Impurities in Graphene

Published:2012-11-15 Issue:20 Volume:109 Page:
ISSN:0031-9007
Container-title:Physical Review Letters
language:en
Short-container-title:Phys. Rev. Lett.

Author:

Zhou Wu,Kapetanakis Myron D.,Prange Micah P.,Pantelides Sokrates T.,Pennycook Stephen J.,Idrobo Juan-Carlos

Funder

National Science Foundation

U.S. Department of Energy

Publisher

American Physical Society (APS)

Subject

General Physics and Astronomy

Link

http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevLett.109.206803/fulltext

Reference28 articles.

1. Scanning tunneling microscopy of semiconductor surfaces

2. Visualizing Individual Nitrogen Dopants in Monolayer Graphene

3. Experimental analysis of charge redistribution due to chemical bonding by high-resolution transmission electron microscopy

4. Atomic-resolution chemical analysis using a scanning transmission electron microscope

5. Simultaneous STEM imaging and electron energy-loss spectroscopy with atomic-column sensitivity

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