Measurement of the silicon (111) surface contraction
Author:
Publisher
American Physical Society (APS)
Subject
General Physics and Astronomy
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevLett.56.236/fulltext
Reference23 articles.
1. Ion beam crystallography of silicon surfaces III. Si(111)-(7 × 7)
2. Low-Energy Electron Diffraction Determination of the Atomic Arrangement on Impurity-Stabilized Unreconstructed Si{111} Surfaces
3. Atomic structure of laser annealed Si(111)–(1×1)
4. Stacking-fault model for the Si(111)-(7×7) surface
5. Atomic Displacements in the Si(111)-(7×7) Surface
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