Direct Resolution and Identification of the Sublattices in Compound Semiconductors by High-Resolution Transmission Electron Microscopy-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Direct Resolution and Identification of the Sublattices in Compound Semiconductors by High-Resolution Transmission Electron Microscopy

Published:1986-12-15 Issue:24 Volume:57 Page:3073-3076
ISSN:0031-9007
Container-title:Physical Review Letters
language:en
Short-container-title:Phys. Rev. Lett.

Author:

Ourmazd A.,Rentschler J. R.,Taylor D. W.

Publisher

American Physical Society (APS)

Subject

General Physics and Astronomy

Link

http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevLett.57.3073/fulltext

Reference3 articles.

1. Lattice and atomic structure imaging of semiconductors by high resolution transmission electron microscopy

2. Interpreting high-resolution transmission electron micrographs

Cited by 36 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. High-Resolution Electron Microscopy of Interfaces;Reference Module in Materials Science and Materials Engineering;2016

2. Interfaces;Materials Science and Technology;2013-02-15

3. High-resolution Electron Microscopy of Interfaces;Encyclopedia of Materials: Science and Technology;2001

4. Transmission electron microscopy and X-ray diffraction studies of quantum wells;Bulletin of Materials Science;1999-10

5. Polarity of epitaxial layers and (1210)prismatic defects in GaN and AIN grown on the (0001)Sisurface of 6H-SiC;Philosophical Magazine A;1997-12

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP