Self-Trapped Excitons in Silicon Dioxide: Mechanism and Properties
Author:
Publisher
American Physical Society (APS)
Subject
General Physics and Astronomy
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevLett.95.156401/fulltext
Reference34 articles.
1. High-κ gate dielectrics: Current status and materials properties considerations
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