Hard-X-Ray Directional Dark-Field Imaging Using the Speckle Scanning Technique
Author:
Funder
Diamond Light Source Ltd.
Publisher
American Physical Society (APS)
Subject
General Physics and Astronomy
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevLett.114.103901/fulltext
Reference21 articles.
1. Sub-pixel porosity revealed by x-ray scatter dark field imaging
2. A method to extract quantitative information in analyzer-based x-ray phase contrast imaging
3. Hard-X-ray dark-field imaging using a grating interferometer
4. Directional x-ray dark-field imaging of strongly ordered systems
5. Projection angle dependence in grating-based X-ray dark-field imaging of ordered structures
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