High-Fidelity Indirect Readout of Trapped-Ion Hyperfine Qubits-Reference-Cited by-同舟云学术

High-Fidelity Indirect Readout of Trapped-Ion Hyperfine Qubits

Published:2022-04-21 Issue:16 Volume:128 Page:
ISSN:0031-9007
Container-title:Physical Review Letters
language:en
Short-container-title:Phys. Rev. Lett.

Author:

Erickson Stephen D.^ORCID,Wu Jenny J.^ORCID,Hou Pan-Yu^ORCID,Cole Daniel C.^ORCID,Geller Shawn^ORCID,Kwiatkowski Alex,Glancy Scott^ORCID,Knill Emanuel,Slichter Daniel H.,Wilson Andrew C.,Leibfried Dietrich^ORCID

Funder

National Institute of Standards and Technology

University of Colorado

National Science Foundation

Intelligence Advanced Research Projects Activity

Professional Research Experience Program

National Research Council Postdoctoral Fellowship

Publisher

American Physical Society (APS)

Subject

General Physics and Astronomy

Link

http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevLett.128.160503/fulltext

Reference46 articles.

1. High-Fidelity Readout of Trapped-Ion Qubits

2. Scalable simultaneous multiqubit readout with99.99%single-shot fidelity

3. High-Fidelity Preparation, Gates, Memory, and Readout of a Trapped-Ion Quantum Bit

4. High-fidelity manipulation of a qubit enabled by a manufactured nucleus

5. Scalable hyperfine qubit state detection via electron shelving in the 2D5/2 and 2F7/2 manifolds in 171Yb+

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