Contours of Constant Scattering Angle
Author:
Publisher
American Physical Society (APS)
Subject
General Physics and Astronomy
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevLett.61.135/fulltext
Reference10 articles.
1. Analysis of metal alloys by Rayleigh to Compton ratios and X-ray fluorescence peaks in the 50 to 122 keV energy range
2. A large-angle coherent/Compton scattering method for measurement in vitro of trabecular bone mineral concentration
3. A compton scattering spectrometer for determining X-ray photon energy spectra
4. Spin-dependent momentum distribution in iron studied with circularly polarized synchrotron radiation
5. Compton profile measurements with 662-keVγrays
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