Direct Measurement of the Thickness-Dependent Electronic Band Structure ofMoS2Using Angle-Resolved Photoemission Spectroscopy-Reference-Cited by-同舟云学术

Direct Measurement of the Thickness-Dependent Electronic Band Structure ofMoS2Using Angle-Resolved Photoemission Spectroscopy

Published:2013-09-03 Issue:10 Volume:111 Page:
ISSN:0031-9007
Container-title:Physical Review Letters
language:en
Short-container-title:Phys. Rev. Lett.

Author:

Jin Wencan,Yeh Po-Chun,Zaki Nader,Zhang Datong,Sadowski Jerzy T.,Al-Mahboob Abdullah,van der Zande Arend M.,Chenet Daniel A.,Dadap Jerry I.,Herman Irving P.,Sutter Peter,Hone James,Osgood Richard M.

Publisher

American Physical Society (APS)

Subject

General Physics and Astronomy

Link

http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevLett.111.106801/fulltext

Reference31 articles.

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4. Band Structures of Transition-Metal-Dichalcogenide Layer Compounds

5. The band structures of some transition metal dichalcogenides. III. Group VIA: trigonal prism materials

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