Simultaneous Scanning Ion Conductance Microscopy and Atomic Force Microscopy with Microchanneled Cantilevers-Reference-Cited by-同舟云学术

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Simultaneous Scanning Ion Conductance Microscopy and Atomic Force Microscopy with Microchanneled Cantilevers

Published:2015-12-03 Issue:23 Volume:115 Page:
ISSN:0031-9007
Container-title:Physical Review Letters
language:en
Short-container-title:Phys. Rev. Lett.

Author:

Ossola Dario,Dorwling-Carter Livie,Dermutz Harald,Behr Pascal,Vörös János,Zambelli Tomaso

Funder

Schweizerischer Nationalfonds zur Förderung der Wissenschaftlichen Forschung

Seventh Framework Programme

Publisher

American Physical Society (APS)

Subject

General Physics and Astronomy

Link

http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevLett.115.238103/fulltext

Reference33 articles.

1. Atomic Force Microscope

2. In situ investigations of single living cells infected by viruses

3. Imaging of the Surface of Living Cells by Low-Force Contact-Mode Atomic Force Microscopy

4. The Scanning Ion-Conductance Microscope

5. Specialized scanning ion‐conductance microscope for imaging of living cells

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