Conservation of the Lateral Electron Momentum at a Metal-Semiconductor Interface Studied by Ballistic Electron Emission Microscopy
Author:
Publisher
American Physical Society (APS)
Subject
General Physics and Astronomy
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevLett.102.136807/fulltext
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1. Direct investigation of subsurface interface electronic structure by ballistic-electron-emission microscopy
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3. Role of elastic scattering in ballistic-electron-emission microscopy of Au/Si(001) and Au/Si(111) interfaces
4. Beam divergence from sharp emitters in a general longitudinal magnetic field
5. Ballistic electron transport through Au(111)/Si(111) and Au(111)/Si(100) interfaces
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