Optical Fingerprint of Flat Substrate Surface and Marker-Free Lateral Displacement Detection with Angstrom-Level Precision-Reference-Cited by-同舟云学术

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Optical Fingerprint of Flat Substrate Surface and Marker-Free Lateral Displacement Detection with Angstrom-Level Precision

Published:2022-11-15 Issue:21 Volume:129 Page:
ISSN:0031-9007
Container-title:Physical Review Letters
language:en
Short-container-title:Phys. Rev. Lett.

Author:

Lin Shupei^ORCID,He Yong,Feng Delong,Piliarik Marek^ORCID,Chen Xue-Wen^ORCID

Funder

National Natural Science Foundation of China

Science and Technology Department of Hubei Province

The Czech Science Foundation

Akademie Věd České Republiky

Publisher

American Physical Society (APS)

Subject

General Physics and Astronomy

Link

http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevLett.129.213201/fulltext

Reference50 articles.

1. Phase contrast, a new method for the microscopic observation of transparent objects part II

2. Holomicrography: Transformation of Image during Reconstruction a posteriori

3. THE MECHANISM OF ADHESION OF CELLS TO GLASS

4. Detection and Spectroscopy of Gold Nanoparticles Using Supercontinuum White Light Confocal Microscopy

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