Surface-sensitive measurement of dielectric screening via atom and electron manipulations
Author:
Funder
Korea Research Institute of Standards and Science
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.94.195308/fulltext
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1. Theory of Donor and Acceptor States in Silicon and Germanium
2. Neutral impurity scattering in semiconductors
3. Ionized-Impurity Scattering Mobility of Electrons in Silicon
4. Coulomb Energy Determination of a Single Si Dangling Bond
5. Strength of the Effective Coulomb Interaction at Metal and Insulator Surfaces
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