Determination of theGe-nanocrystal/SiO2matrix interface trap density from the small signal response of charge stored in the nanocrystals
Author:
Publisher
American Physical Society (APS)
Subject
Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.82.195415/fulltext
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1. Fast and long retention-time nano-crystal memory
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3. Electronic properties of Ge nanocrystals for non volatile memory applications
4. Visible photoluminescence from nanocrystallite Ge embedded in a glassySiO2matrix: Evidence in support of the quantum-confinement mechanism
5. Size-dependent near-infrared photoluminescence from Ge nanocrystals embedded inSiO2matrices
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