Structural determination of indium-induced Si(111) reconstructed surfaces by LEED analysis:(3×3)R30°and (4×1)

Author:

Mizuno S.,Mizuno Y. O.,Tochihara H.

Publisher

American Physical Society (APS)

Cited by 55 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Structural dynamics in atomic indium wires on silicon: From ultrafast probing to coherent vibrational control;Progress in Surface Science;2024-06

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3. Structure and Electronic Properties of In Single-Layer Metal on Si(111);Structure and Electronic Properties of Ultrathin In Films on Si(111);2022

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5. Effects of two kinds of intercalated In films on quasi-free-standing monolayer graphene formed above SiC(0001);Carbon;2020-04

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