Observation of ultralow-level Al impurities on a silicon surface by high-resolution grazing emission x-ray fluorescence excited by synchrotron radiation-Reference-Cited by-同舟云学术

Observation of ultralow-level Al impurities on a silicon surface by high-resolution grazing emission x-ray fluorescence excited by synchrotron radiation

Published:2009-09-21 Issue:11 Volume:80 Page:
ISSN:1098-0121
Container-title:Physical Review B
language:en
Short-container-title:Phys. Rev. B

Author:

Kubala-Kukuś A.,Banaś D.,Cao W.,Dousse J.-Cl.,Hoszowska J.,Kayser Y.,Pajek M.,Salomé M.,Susini J.,Szlachetko J.,Szlachetko M.

Publisher

American Physical Society (APS)

Subject

Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.80.113305/fulltext

Reference12 articles.

1. Quo Vadis total reflection X-ray fluorescence?

2. Aluminum impurities in silicon: Investigation of x-ray Raman scattering in total reflection x-ray fluorescence spectroscopy

3. X-Ray Evanescent-Wave Absorption and Emission

4. Calculation of intensities in grazing-emission x-ray fluorescence

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