Transport and reactions of gold in silicon containing cavities
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.57.7015/fulltext
Reference45 articles.
1. Diffusion of gold in dislocation-free or highly dislocated silicon measured by the spreading-resistance technique
2. Diffusion of ion‐implanted gold inp‐type silicon
3. Gold diffusion in silicon by Rapid Optical Annealing
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