Scattering and spectral shape in ballistic-electron-emission microscopy ofNiSi2-Si(111) and Au-Si samples
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.46.7256/fulltext
Reference8 articles.
1. Direct investigation of subsurface interface electronic structure by ballistic-electron-emission microscopy
2. Observation of Interface Band Structure by Ballistic-Electron-Emission Microscopy
3. Ballistic-electron-emission microscopy and spectroscopy of GaP(110)-metal interfaces
4. Computation of quantum mechanical transmission probability from plane interfaces using electronic band structures
5. Theory of ballistic-electron-emission spectroscopy ofNiSi2/Si(111) interfaces
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