Interdiffusion in nanometer-scale multilayers investigated byin situlow-angle x-ray diffraction
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.59.10811/fulltext
Reference65 articles.
1. Interdiffusion in Si/Ge amorphous multilayer films
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3. Measurements of interdiffusion in electrodeposited nickel‐phosphorus multilayers
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