Frequency-modulated atomic force spectroscopy on NiAl(110) partially covered with a thin alumina film
Author:
Publisher
American Physical Society (APS)
Subject
Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.73.125320/fulltext
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1. Atomic Resolution of the Silicon (111)-(7×7) Surface by Atomic Force Microscopy
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