Analysis of the moving photocarrier grating technique for semiconductors of high defect density
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.64.104201/fulltext
Reference9 articles.
1. Moving grating technique: A new method for the determination of electron and hole mobilities and their lifetime
2. Analysis of the moving-photocarrier-grating technique for the determination of mobility and lifetime of photocarriers in semiconductors
3. Swelling effects in lithium fluoride induced by swift heavy ions
4. The moving-photocarrier-grating technique for the determination of transport parameters in thin film semiconductors
5. Determination of transport parameters in fullerene films
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