Interwire coupling forIn(4×1)/Si(111) probed by surface transport-Reference-Cited by-同舟云学术

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Interwire coupling forIn(4×1)/Si(111) probed by surface transport

Published:2015-08-25 Issue:8 Volume:92 Page:
ISSN:1098-0121
Container-title:Physical Review B
language:en
Short-container-title:Phys. Rev. B

Author:

Edler F.,Miccoli I.,Demuth S.,Pfnür H.,Wippermann S.,Lücke A.,Schmidt W. G.,Tegenkamp C.

Funder

Deutsche Forschungsgemeinschaft

Publisher

American Physical Society (APS)

Subject

Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.92.085426/fulltext

Reference39 articles.

1. Colloquium: Electronic instabilities in self-assembled atom wires

2. In-Si(111)(4 × 1)/(8 × 2) nanowires: Electron transport, entropy, and metal-insulator transition

3. Surface-State Electrical Conductivity at a Metal-Insulator Transition On Silicon

4. Anisotropy in Conductance of a Quasi-One-Dimensional Metallic Surface State Measured by a Square Micro-Four-Point Probe Method

5. The 100th anniversary of the four-point probe technique: the role of probe geometries in isotropic and anisotropic systems

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1. Transport characteristics of epitaxial graphene proximitized to a two-dimensional Pb interface layer;Physical Review B;2024-06-26

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3. Charge-transfer transition in Au-induced quantum wires on Si(553);Physical Review B;2019-07-24

4. Space charge layer effects in silicon studied by in situ surface transport;Journal of Physics: Condensed Matter;2019-03-19

5. Efficient PAW-based bond strength analysis for understanding the In/Si(111)(8 × 2) - (4 × 1) phase transition;Journal of Computational Chemistry;2017-07-18

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