Multiply charged ions from electron bombardment ofSiO2
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.41.9541/fulltext
Reference29 articles.
1. The surfaces of metal oxides
2. Stimulated desorption
3. Characterization of Surfaces Through Electron and Photon Stimulated Desorption
4. Fundamental Mechanisms of Desorption and Fragmentation Induced by Electronic Transitions at Surfaces
5. Summary Abstract: The origin of oxidation induced enhancement of Si+ sputter yield in SIMS
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