Microstructure of thermally grown and deposited alumina films probed with positrons-Reference-Cited by-同舟云学术

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Microstructure of thermally grown and deposited alumina films probed with positrons

Published:1999-03-01 Issue:10 Volume:59 Page:6675-6688
ISSN:0163-1829
Container-title:Physical Review B
language:en
Short-container-title:Phys. Rev. B

Author:

Somieski Bertram,Hulett Lester D.,Xu Jun,Pint Bruce A.,Tortorelli Peter F.,Nielsen Bent,Asoka-Kumar Palakkal,Suzuki Ryoichi,Ohdaira Toshiyuki

Publisher

American Physical Society (APS)

Link

http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.59.6675/fulltext

Reference57 articles.

1. Experimental observations in support of the dynamic-segregation theory to explain the reactive-element effect

2. Investigation of Thermal Equilibrium Vacancies in Metals by Positron Annihilation

3. Defects in Semiconductors: Recent Progress in Positron Experiments

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3. Study of corrosion-related defects of zirconium alloys with slow positron beam;Journal of Nuclear Materials;2018-09

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