Observation of Si(001) surface topography at temperatures below 1140t°C using a reflection electron microscope
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.55.1864/fulltext
Reference24 articles.
1. Observation of unimolecular growth steps on crystal surfaces
2. Optical imaging of microroughness on polished silicon wafers
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4. Observation of the Ag/Si(111) system using a high-resolution ultra-high vacuum scanning electron microscope
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