Far-infrared studies of the cyclotron-resonance line shape of two-dimensional electrons in silicon in the quantum limit
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.44.3070/fulltext
Reference37 articles.
1. Electronic properties of two-dimensional systems
2. New Method for High-Accuracy Determination of the Fine-Structure Constant Based on Quantized Hall Resistance
3. Fractional Quantization of the Hall Effect
4. Cyclotron resonance of electrons in surface space-charge layers on silicon
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