Electron drift velocity in silicon
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.12.2265/fulltext
Reference51 articles.
1. Measurement of high-field carrier drift velocities in silicon by a time-of-flight technique
2. Drift mobility techniques for the study of electrical transport properties in insulating solids
3. Negative differential mobility in III–V and II–VI semiconducting compounds
4. Drift velocity of electrons and holes and associated anisotropic effects in silicon
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