Compressive effects in melting of palladium thin films studied by ultrafast x-ray diffraction-Reference-Cited by-同舟云学术

Compressive effects in melting of palladium thin films studied by ultrafast x-ray diffraction

Published:2023-06-12 Issue:21 Volume:107 Page:
ISSN:2469-9950
Container-title:Physical Review B
language:en
Short-container-title:Phys. Rev. B

Author:

Suzana Ana F.^ORCID,Koch Robert,Wu Longlong^ORCID,Assefa Tadesse A.^ORCID,Kim Sungwon,Choi Sungwook^ORCID,Lee Heemin^ORCID,Kim Sunam^ORCID,Lee Jae Hyuk^ORCID,Park Sang-Youn,Nam Daewoong,Kim Sangsoo^ORCID,Hyun Hyojung^ORCID,Kim Kyung Sook,Wright Gwen,Bozin Emil S.,Song Changyong,Kim Hyunjung,Billinge Simon J. L.^ORCID,Robinson Ian K.

Funder

U.S. Department of Energy

National Research Foundation of Korea

Korea Institute of Science and Technology Information

Publisher

American Physical Society (APS)

Link

http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.107.214303/fulltext

Reference25 articles.

1. Real-Time Visualization of Nanocrystal Solid–Solid Transformation Pathways

2. Imaging transient melting of a nanocrystal using an X-ray laser

3. Ultrafast x-ray diffraction study of melt-front dynamics in polycrystalline thin films

4. Femtosecond Visualization of Lattice Dynamics in Shock-Compressed Matter

5. Ultrafast observation of lattice dynamics in laser-irradiated gold foils

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1. Structural pathways for ultrafast melting of optically excited thin polycrystalline Palladium films;Acta Materialia;2024-09

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