Development of a self-consistent free-form approach for studying the three-dimensional morphology of a thin film
Author:
Publisher
American Physical Society (APS)
Subject
Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.85.125439/fulltext
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1. High-Resolution X-Ray Scattering
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