Electronic properties and bonding in ZrHx thin films investigated by valence-band x-ray photoelectron spectroscopy-Reference-Cited by-同舟云学术

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Electronic properties and bonding in ZrHx thin films investigated by valence-band x-ray photoelectron spectroscopy

Published:2017-11-01 Issue:19 Volume:96 Page:
ISSN:2469-9950
Container-title:Physical Review B
language:en
Short-container-title:Phys. Rev. B

Author:

Magnuson Martin,Schmidt Susann,Hultman Lars,Högberg Hans

Funder

Linköpings Universitet

Stiftelsen för Strategisk Forskning

Carl Tryggers Stiftelse för Vetenskaplig Forskning

Publisher

American Physical Society (APS)

Link

http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.96.195103/fulltext

Reference35 articles.

1. Zirconium in the Nuclear Industry: Thirteenth International Symposium

2. The Effect of Hydrogen and Hydrides on the Integrity of Zirconium Alloy Components

3. Hexagonal-based ordered phases in H-Zr

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