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Far infrared spectroscopy ofPb1−xEuxTeepitaxial layers

  • Published:2010-11-02 Issue:20 Volume:82 Page:
  • ISSN:1098-0121
  • Container-title:Physical Review B
  • language:en
  • Short-container-title:Phys. Rev. B

Author:

Zhukova E. S.,Aksenov N. P.,Gorshunov B. P.,Selivanov Yu. G.,Zasavitskiy I. I.,Wu D.,Dressel M.

Publisher

American Physical Society (APS)

Subject

Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Cited by 5 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Bulk Cyclotron Resonance in the Topological Insulator Bi2Te3;Crystals;2020-08-20

2. Rare‐earth‐incorporated low‐dimensional chalcogenides: Dry‐method syntheses and applications;InfoMat;2020-02-03

3. Thermalization of electron–positron plasma with quantum degeneracy;Physics Letters A;2019-01

4. Far infrared and terahertz spectroscopy of ferroelectric soft modes in thin films: A review;Ferroelectrics;2016-10-20

5. Pb1-xEuxTe: refractive index, absorption coefficient;New Data and Updates for several Semiconductors with Chalcopyrite Structure, for several II-VI Compounds and diluted magnetic IV-VI Compounds;2013
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