Dangling bonds on silicon
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.17.1893/fulltext
Reference67 articles.
1. Review of Electron Paramagnetic Resonance Investigations of Semiconductor Surfaces
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4. New ESR Investigation of the Cleaved-Silicon Surface
5. Low-Temperature EPR Measurements onin situVacuum-Cleaved Silicon
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