Dynamics and microscopic origin of fast 1.5μm emission in Er-doped SiO2sensitized with Si nanocrystals
Author:
Publisher
American Physical Society (APS)
Subject
Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.83.155323/fulltext
Reference28 articles.
1. Excitation cross section of erbium in semiconductor matrices under optical pumping
2. Optical properties of PECVD erbium-doped silicon-rich silica: evidence for energy transfer between silicon microclusters and erbium ions
3. 1.54 μm photoluminescence of Er3+ doped into SiO2 films containing Si nanocrystals: Evidence for energy transfer from Si nanocrystals to Er3+
4. Sensitization of Er luminescence by Si nanoclusters
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3. Step-like increase of quantum yield of 1.5 μm Er-related emission in SiO2 doped with Si nanocrystals;Journal of Applied Physics;2015-02-14
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