Determination of the absolute structure factor for the forbidden (222) reflection in silicon using 0.12-Åγrays
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.26.3097/fulltext
Reference19 articles.
1. The Intensity of X-Ray Reflection by Diamond
2. Anharmonicity and the Temperature Dependence of the Forbidden (222) Reflection in Silicon
3. Forbidden (222) Neutron Reflection in Silicon: Anharmonicity and the Bonding Electrons
4. Diffraction studies of the (222) reflection in Ge and Si: Anharmonicity and the bonding electron
5. Ground-state electronic properties of diamond in the local-density formalism
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