Spontaneous hot-carrier photon emission rates in silicon: Improved modeling and applications to metal oxide semiconductor devices

Author:

Pavesi M.,Rigolli P. L.,Manfredi M.,Palestri P.,Selmi L.

Publisher

American Physical Society (APS)

Cited by 10 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Why Cryptography Should Not Rely on Physical Attack Complexity;T-Labs Series in Telecommunication Services;2015

2. Simple photonic emission analysis of AES;Journal of Cryptographic Engineering;2013-02-21

3. Highly resolved spatial and temporal photoemission analysis of integrated circuits;Measurement Science and Technology;2013-01-29

4. The Path Forward: Silicon Electro-Optical Interface for Modern Complementary Metal-Oxide-Semiconductor Integrated Circuits (CMOS ICs);2013 CIOMP-OSA Summer Session on Optical Engineering, Design and Manufacturing;2013

5. Ultraviolet Light Emission from Si in a Scanning Tunneling Microscope;Physical Review Letters;2007-12-13

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