Initial stage of Ag growth on Si(001) studied by high-resolution Rutherford-backscattering spectroscopy
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.52.5737/fulltext
Reference18 articles.
1. Initial formation process of metal/silicon interfaces
2. Deposition of Ag on Si(100) Surfaces as Studied by LEED-AES
3. A LEED-AES study of the growth of Ag films on Si(100)
4. Nucleation, growth and the intermediate layer in Ag/Si(100) and Ag/Si(111)
5. Determination of the bonding and growth of Ag on Si(100)-(2×1)
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